Hi Stephen,
Thank you for the images. These gate transitions look to be free of any shoot-through, have you checked all three of the phases?
On the three high-side MOSFETs, is there any significant copper area connected to the Drain of these devices? The damaging you're seeing may just be from poor layout of the MOSFETs resulting in the devices overheating under normal operating conditions.
Have you used our EVM as a reference for correct thermal via placement and copper area widths?
Thank you for the images. These gate transitions look to be free of any shoot-through, have you checked all three of the phases?
On the three high-side MOSFETs, is there any significant copper area connected to the Drain of these devices? The damaging you're seeing may just be from poor layout of the MOSFETs resulting in the devices overheating under normal operating conditions.
Have you used our EVM as a reference for correct thermal via placement and copper area widths?