Hi Marco,
It is difficult to determine the reason without examining what occurred prior to the fault. The device reported several faults.
It is recommended to set the scope to capture the phase currents and the VM voltage prior to the fault. This should provide clues to what fault occurred. If you have a temperature probe you can add this to determine if the device is overheating.
It is difficult to determine the reason without examining what occurred prior to the fault. The device reported several faults.
It is recommended to set the scope to capture the phase currents and the VM voltage prior to the fault. This should provide clues to what fault occurred. If you have a temperature probe you can add this to determine if the device is overheating.
